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1 article(s) from Gröger, Roland

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

Tobias Meier,
Alexander Förste,
Ali Tavassolizadeh,
Karsten Rott,
Dirk Meyners,
Roland Gröger,
Günter Reiss,
Eckhard Quandt,
Thomas Schimmel and
Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

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Figure 1: Schematic and photo of the setup including the optical beam deflection and the nested scanner desig...

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Figure 2: A crucial precondition for a nested high resolution scanner design is the stability of the housing ...

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Figure 3: a) Optical microscopy image of a SiO_x calibration grating with various feature sizes. Demonstration...

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Figure 4: a) Overlay of the optical microscope image with the AFM topography of an optical grating structure ...

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Figure 5: Characterization of AFM cantilevers equipped with strain sensitive TMR sensors. a) The cantilevers ...

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Figure 6: a) To improve lateral resolution, tips with a tip radius of 30 nm were grown by a combination of fo...

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Figure 7: Dynamic mode imaging of FDTS-SAM samples using a TMR sensor with the feedback on amplitude and phas...

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Published 13 Feb 2015

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